QUASES-XS-REELS (developed by Sven Tougaard)
Software for Quantitative analysis of REELS Includes facilities for
Purpose of the software The inelastic electron scattering cross section gives valuable information on the electronic structure of the surface region of the solid. The software corrects the spectrum for the multiple scattered electrons and determines the effective inelastic scattering cross section. In the past, experimental methods to determine the inelastic scattering cross section for electrons moving in solids have largely relied on experiments where electrons passed through an extremely thin solid film. Such experiments are however exceptionally difficult and for electron energies below ~ 10 keV such experiments can only be carried out for a few special solids. In the present method, the inelastic electron scattering cross section is determined from analysis of the energy distribution of a mono-energetic beam of electrons that is reflected from a solid surface so-called Reflection Electron Energy Loss Spectroscopy (REELS). This is a very simple experiment that can be easily implemented for almost any solid. The experimental facility is available in most surface analytical labs.
This software is the first step in applications of the software QUASES-ε(k,ω)-REELS and QUASES-XS-REELS is included with that software package. |
Downloads Theory and early applications
“Differential Inelastic-Electron Scattering Cross Sections from Experimental Reflection-Electron Energy-Loss Spectra: Application to Background Removal in Electron Spectroscopy”.
“Inelastic Electron Scattering Cross Sections for Si, Cu, Ag, Au, Ti, Fe, and Pd”.
|
|
|
The measured REELS spectrum. |
The determined effective cross section for inelastic electron scattering |